The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 1986
Filed:
Feb. 17, 1984
Applicant:
Inventor:
Jeffrey H Everson, Reading, MA (US);
Assignee:
Honeywell Inc., Minneapolis, MN (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ;
Abstract
An apparatus and method for noncontact and nondestructive test of a photodiode array are given. Such apparatus comprises a Surface Acoustic Wave (SAW) device having one or more sets of interdigital finger pairs placed on each end of the device, separated by slotted waveguide which confines the SAW test probe test signal to a row of diodes to be tested and which is positioned immediately above the waveguide. The SAW device is coupled to signal processing electronics from which individual detector properties, such as the zero voltage bias resistance of each detector, may be calculated.