The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 1986

Filed:

Jul. 15, 1985
Applicant:
Inventors:

Andrew Stefanski, Menlo Park, CA (US);

Alfred H Sturtevant, Palo Alto, CA (US);

Michael G Konicek, Cupertino, CA (US);

Peter E Lobban, Palo Alto, CA (US);

Assignee:

Sequoia-Turner Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2504581 ; 2504591 ; 356317 ;
Abstract

Variations in the intensity of a light source and the sensitivity of a fluorescence detector photo-multiplier tube are simultaneously compensated by measuring the intensity (I.sub.LS1) of the light source at the sample excitation frequency with a silicon detector, measuring the intensity (I.sub.LS2) of the light source at the emission frequency with another silicon detector, measuring with the photo-multiplier detector the intensity (I.sub.S) of the sample's fluorescence and the intensity (I.sub.LS3) of the light source at the emission frequency of the sample and then calculating a value F as representative of the sample's fluorescence according to the formula: ##EQU1##


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