The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 1986

Filed:

Aug. 10, 1984
Applicant:
Inventor:

Karl-Heinz Hirschmann, Stuttgart, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33503 ; 33558 ; 33 / ;
Abstract

A multiple-coordinate scanner having regulated scanning force for scanning objects, and preferably for length- and gear-measuring machines, is disclosed. The scanner detects the scanning force via a multiple-coodinate force measuring device and uses it to regulate the scanning force, in that corresponding straight-line guides in the multiple-coordinate scanner are deflected by drive units such that the resultant measuring force corresponds to a predetermined magnitude, regardless of the direction and magnitude of the multiple-coordinate scanner deflection.


Find Patent Forward Citations

Hirschmann, Karl-Heinz. (1986). Multiple-coordinate scanner with regulated scanning force (U.S. Patent No. 4621434). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4621434

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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