The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 1986

Filed:

May. 25, 1984
Applicant:
Inventors:

Cornelis M van Uijen, Eindhoven, NL;

Johannes H den Boef, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324307 ; 324311 ; 324309 ;
Abstract

During measurement cycles for generating and sampling FID signals in NMR imaging devices, a 180.degree. pulse and subsequently a 90.degree. excitation pulse are added to the pulse sequence. The 180.degree. pulse produces an additional echo signal. During (the maximum of) the echo signal, the 90.degree. pulse is generated. The waiting period occurring before the beginning of a next measurement cycle can thus be substantially reduced without giving rise to a significant signal loss in the echo signals to be generated during said cycle. In addition to a reduction of the measurement time, NMR images with different contrasts (other intensity distribution) can be provided.


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