The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 1986
Filed:
Dec. 29, 1983
Robert P Schnell, Deerfield, IL (US);
Robert W Sampson, Wayne, IL (US);
Ronald F Pacanowski, Hoffman Estates, IL (US);
Donald J Bruggema, Wheeling, IL (US);
UOP Inc., Des Plaines, IL (US);
Abstract
Methods and apparatus are provided for qualitative and quantitative analysis utilizing the Raman effect. Analyses are obtainable without exercise of human judgment or human interpretation. Analyses may be obtained on-line in the field or in a laboratory. A wide range of fluids and solids are capable of rapid routine analysis without major adjustment of equipment. An analysis is obtained by comparing a Raman spectrum of the unknown sample to Raman spectra of samples whose analysis is known. The known Raman spectra are stored in computing means in digital form and the comparison is accomplished by the computing means.