The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 1986

Filed:

Oct. 21, 1983
Applicant:
Inventors:

Antonius H Peels, Eindhoven, NL;

Antonius J van den Beld, Eindhoven, NL;

Jan Bijma, Eindhoven, NL;

Jan Gerritsen, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
315 15 ; 313414 ; 313449 ;
Abstract

The spot quality of an electron beam produced by an electron gun in a cathode ray tube is improved by optimizing the dimensions of a beam-forming, apertured electrode arrangement in the gun. This arrangement includes electrodes for forming a cross-over followed by, in the direction of propagation of the electron beam, first and second lens electrodes centered around an axis, for defining an accelerating and prefocusing lens and at least two lens electrodes for defining a main focusing lens. The diameter of the aperture in the second lens electrode is smaller than twice the diameter of the aperture in the first lens electrode, and the effective spacing S-eff between the first and the second lens electrodes is smaller than 1 mm. S-eff is defined as the minimum of the function ##EQU1## where .DELTA.V is the operating voltage difference between the second and first lens electrodes and


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