The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 1986
Filed:
Jan. 04, 1983
Applicant:
Inventors:
Tohru Iuchi, Kawasaki, JP;
Fumio Tanaka, Kawasaki, JP;
Assignee:
Nippon Steel Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356358 ; 73657 ;
Abstract
An interferometric contact-free measuring method for sensing, by a laser beam, motional surface deformation of a workpiece subject to an ultrasonic vibration, comprising splitting the laser beam into a measuring beam incident upon a measuring point on the workpiece and a reference beam incident upon a reference point close to the measuring point, and bringing the two beams, after reflection, into a common optical detector.