The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 1986

Filed:

Dec. 20, 1984
Applicant:
Inventors:

Mark S Young, Mountain View, CA (US);

John Drew, Los Gatos, CA (US);

Michael C Shebanow, Berkeley, CA (US);

Vineet Dujari, San Jose, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
360 51 ; 360 39 ;
Abstract

A method and apparatus for reading data from a disk having missing or unreadable field address marks. Expected address marks are searched for within a time window which is generated using a counter. When an expected address mark is generated at any time within the time window, the counter is set or reset to generate another time window within which the next address mark is expected to occur. By starting or restarting the counter each time an expected address mark is detected the effects of variations in spindle speed which occur prior to the detection of the address mark are eliminated, thus increasing the probability that readable address marks will be detected within a time window.


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