The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1986
Filed:
Mar. 27, 1984
Gerard Mourou, Rochester, NY (US);
Janis A Valdmanis, Westfield, NJ (US);
The University of Rochester, Rochester, NY (US);
Abstract
Electrical signals are measured (analyzed and displayed) with subpicosecond resolution by electro-optic sampling of the signal in an electro-optic crystal, the index of which changes in response to the electric field produced by the signal, in accordance with the Pockels effect. The crystal is disposed adjacent to and in the fringe field of a line on a substrate, which may be part of an integrated circuit, for measuring signals propagating along the line during the operation of the circuit. A beam of short optical (laser) sampling pulses in the picosecond range is focused preferably close to the surface of the crystal and perpendicular to the optical axis of the crystal. The optical pulses transmitted through the crystal are processed to provide a display affording a measurement of the electrical signal.