The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 1986

Filed:

Nov. 14, 1983
Applicant:
Inventor:

Carl A Farren, Placentia, CA (US);

Assignee:

Beckman Industrial Corporation, Fullerton, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250343 ; 250345 ;
Abstract

An improved non-dispersive infrared analyzer. The analyzer includes an improved source assembly having a reflecting element with a concave annular reflecting surface, and a circular heating element which is located substantially at the focal region of the reflective surface. The analyzer also includes an improved detecting assembly having a reflecting element with a paraboloid reflective surface that focuses radiation on one or more detecting elements that are located out of the field of view of the reflecting element. Because of the better collimation and more efficient use of its infrared beam, analyzers which include these source and detecting assemblies may use sample cells having non-reflective inner surfaces, and thereby provide output signals of improved stability.


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