The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 1986

Filed:

Mar. 25, 1985
Applicant:
Inventors:

Makihiko Mori, Kitakatsuragigun, JP;

Kazuo Nakamura, Habikinoshi, JP;

Kanichiro Tanabe, Sagamiharashi, JP;

Atsushi Kimura, Urawashi, JP;

Assignees:

Osaka Gas Company Limited, both of, JP;

Nireco Corporation, both of, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ; H04N / ;
U.S. Cl.
CPC ...
382 28 ; 358107 ; 382 52 ;
Abstract

A method and an apparatus for automatic quantitative measurement of textures by image analysis for measuring textures of a material containing various optically anisotropic textures. An image of the material is divided into a plurality of sections and brightness of each section is classified into a plurality of stages to be stored as gray levels of the sections or pixels. Image patterns of the textures are recognized on the basis of gray level variations observed before and after a mask movement, and the textures of the material are determined according to predetermined criteria.


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