The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 1986
Filed:
Nov. 16, 1983
Asao Hayashi, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A method of detecting a focus condition of an imaging optical system such as a camera, a microscope, a high density optical recording and reproducing apparatus or the like is disclosed. The method comprises a step of selecting, in accordance with the state of density distribution of the optical image, between an image sharpness detection method for detecting in-focused condition by obtaining an evaluation value representing sharpness of images projected upon a photoelectric detecting means and an image lateral shift detection method for detecting in-focused condition by a positional relation between an image projected upon the photoelectric detecting means by light fluxes transmitted through a part of an exit pupil of an optical lens and an image projected upon the photoelectric detecting means by light fluxes transmitted through the other part of the exit pupil of the lens.