The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 1986
Filed:
Sep. 27, 1984
Katsuzi Ikenaga, Kudamatsu, JP;
Masao Takai, Kudamatsu, JP;
Nobuyuki Nakashima, Kudamatsu, JP;
Koji Umemoto, Kudamatsu, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An ultrasonic microscope has an optical microscope disposed in juxtaposition therewith so that the optical microscope can directly observe a specimen to be observed by the ultrasonic microscope, by moving the specimen toward the optical microscope. The optical microscope can also observe a region where an acoustic lens of the ultrasonic microscope and the specimen face each other. For that purpose, the optical microscope is provided with an optical reflector for suiting the view of field of the optical microscope to the region where the acoustic lens and the specimen face each other. Alternatively, the optical microscope is swingably supported so that the view of field of the optical microscope is suited to the region where the acoustic lens and specimen face each other.