The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 1986
Filed:
Feb. 13, 1985
Applicant:
Inventor:
Shigeru Suga, Shibuya-ku, Tokyo, JP;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356446 ;
Abstract
A method and apparatus for measuring the gloss of a surface of a material by receiving light reflected from the surface and measuring the amount of light. Parallel light rays from a light source are directed against the surface the gloss of which is to be determined at an angle of incidence, and a cross-section of light rays reflected from the surface at an angle of reflection equal to the angle of incidence is received and the central region of the cross-section of the light rays is blocked out by a light intercepting plate, so that only the light received after the blocking out of the central region is used as a determination of the gloss of the surface.