The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 1986
Filed:
Aug. 02, 1984
Siemens Aktiengesellschaft, Berlin & Munich, DE;
Abstract
A device for observing the ends of optical waveguides, which ends are being adjusted relative to each other for splicing purposes, characterized by two separate microscopes arranged to view adjustments along two perpendicularly extending directions. Each of the microscopes has a mirror arrangement for bending the optical paths onto a common intermediate image plane and the microscopes have a common eyepiece for observing the common intermediate image plane so that adjustments along both directions can be observed without changing eyepieces. Preferably, a diaphragm is provided to be alternately moved into the path of one microscope to block the vision while observing the view of the other microscope.