The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 1986
Filed:
Jun. 27, 1984
Sarkis Barkhoudarian, Canoga Park, CA (US);
Rockwell International Corporation, El Segundo, CA (US);
Abstract
A leak locating, mapping and measuring system (10) comprising an image recording medium (32), a laser (18), optical components (22) which cooperate with the laser to produce and superimpose successive holographic images of the test subject (12) upon the recording medium, a video camera (34) trained upon the medium and a real-time monitor (35) and recorder (36) for processing the output of the camera to assist analysis. The device is operated to create a first, reference hologram of the test subject while it is in an unpressurized state. A second holographic image is then taken while the test subject is pressurized with fluid from tank (38), which image is superimposed over the reference image. The resultant lines of interference between the superimposed images are then analyzed for distortions (66), which distortions indicate the location and magnitude of leakage flows at or about the test subject. Each holographic image may be created with laser beams of a selected duration which diminishes the effects of vibration in the test subject.