The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 1986

Filed:

Sep. 10, 1984
Applicant:
Inventors:

Curt Brunnee, Platjenwerbe, DE;

Peter Dobberstein, Bremen, DE;

Gunter Kappus, Stuhr, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250281 ; 250288 ; 310331 ;
Abstract

Slit means in spectrometers for the analysis of organic and inorganic substances, in particular in mass spectrometers, have hitherto been controlled for varying the slit widths by connecting them in a suitable manner to a metallic wire, through which an electric current flowed, under the influence of which the wire heats up and changes its length. The slit or diaphragm means connected to the wire were then displaced relative to the beam path. It is a great disadvantage that the diaphragms follow a change of the current for controlling the slit widths with a relatively long time delay, which is unacceptable for various types of measuring operation, in particular types of measuring operation under data system control. To eliminate this disadvantage, a device (11) is proposed which has at least one movable slit jaw (12) which is movable to and fro, substantially perpendicular to the beam path (16) and without delay, by a piezo-electric element (14).


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