The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 1986
Filed:
Mar. 20, 1984
Shinsuke Tanaka, Kanagawa, JP;
Nobutake Imamura, Tokyo, JP;
Kokusai Denshin Denwa Co., Ltd., Tokyo, JP;
Abstract
Amorphous thin film with easy magnetization axis perpendicular to film surface for magneto-optical recording with low recording power and high S/N in reading signal is set forth. The medium is an alloy of heavy rare earth element and iron with substitution of some heavy rare earth elements by light rare earth element, and the preferable chemical formula of the thin film is (R.sub.z A.sub.1-z).sub.x Fe.sub.1-x, or [(R.sub.z A.sub.1-z).sub.y B.sub.1-y ].sub.x Fe.sub.1-x where R is a light rare earth element, A and B are heavy rare earth elements, and the atom ratios satisfy 0.15.ltoreq.x.ltoreq.0.35, 0.00<y<1.00, 0.00<z<1.00. Recording is effected by using Curie point, or magnetic compensation temperature, and reading of information is effected by using the Kerr effect.