The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 1986

Filed:

Nov. 28, 1984
Applicant:
Inventors:

Takaki Shimura, Machida, JP;

Keiichi Murakami, Kawasaki, JP;

Hirohide Miwa, Kawasaki, JP;

Takuso Sato, Shinagawa, JP;

Nobuyuki Ichida, Machida, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128660 ;
Abstract

This invention relates to a system for measuring the non-linear parameter B/A of an ultrasonic medium such as a living tissue, namely the value which indicates a rate of change of the sound velocity with change of pressure, utilizing reflected ultrasonic waves. In this invention, a measuring burst pulse, having a comparatively high frequency, and a pumping pulse, having a comparatively low frequency and a high sound pressure, for giving a change of pressure are transmitted in the same direction while they are superposed, the phase of the reflected waves from each region of the ultrasonic medium is detected as a function of time, and it is then differentiated. Thereby, the distribution of B/A along the transmitting direction of said pulses can be obtained.


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