The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 1986

Filed:

Mar. 14, 1984
Applicant:
Inventor:

Toshiaki Takahashi, Tachikawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356418 ; 3241 / ;
Abstract

Disclosed is an element characteristic measuring apparatus provided with a first illuminating system for uniformly illuminating the whole area of an element, a second illuminating system for providing an imaging illumination to a part area of the element, and an output detector for detecting the output of the illuminated element.


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