The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 1986

Filed:

Dec. 02, 1982
Applicant:
Inventors:

Kohji Tada, Osaka, JP;

Yoshiki Kuhara, Osaka, JP;

Masami Tatsumi, Osaka, JP;

Tsutomu Mitsui, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G02B / ;
U.S. Cl.
CPC ...
324244 ; 324 96 ; 350374 ;
Abstract

A magnetic field and electric current measuring device which uses bismuth silicon oxide (Bi.sub.12 SiO.sub.20) or bismuth germanium oxide (Bi.sub.12 GeO.sub.20) as a Faraday cell, and which is so adapted that polarized light which enters the cell is passed back and forth through the cell along the optic axis thereof to cancel any change in optical rotatory power ascribable to a variation in temperature. A magnetic field applied in the direction of the optic axis of the Faraday cell is measured based on the angle of rotation of the polarization plane of the polarized light. The surface of the Faraday cell may be coated with a transparent and electrically conductive thin film to eliminate the effects of external electric fields.


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