The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 1986

Filed:

Feb. 23, 1984
Applicant:
Inventors:

Mitsuyoshi Takano, Tokyo, JP;

Mamoru Ando, Hiratsuka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; H04B / ;
U.S. Cl.
CPC ...
324 / ; 455197 ; 455249 ; 455169 ; 455226 ; 455186 ;
Abstract

A spectrum analyzer having an automatic attenuator setting function, actuatable to automatically set the degree of attenuation provided by an input attenuator to an optimum value in accordance with the peak level of the frequency span of a signal under measurement, i.e. to a minimum attenuation value consistent with the prevention of generation of spurious signal components through distortion within the spectrum analyzer, e.g. harmonic frequency distortion within the mixer of the spectrum analyzer. Low-level frequency components can thereby be observed without the presence of spurious components on the spectrum analyzer display, with no need for manual input attenuator adjustment. A compensating degree of I.F. amplification is automatically provided to match the attenuation setting.


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