The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1986
Filed:
Dec. 17, 1984
Applicant:
Inventors:
Francois M Mottier, West Hartford, CT (US);
Martin C Foster, Plantsville, CT (US);
Assignee:
United Technologies Corporation, Hartford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356358 ; 356363 ;
Abstract
An optical gauging system comprises a fixture for rotating a workpiece to provide registration of the workpiece surfaces with a measurement optical path and optical interference apparatus for reflecting a measurement optical beam off said surfaces to provide an optical interference signal indicative of the distance between successive surfaces.
Quick Actions:
Mottier, Francois. (1986). Broad bandwidth interferometric gauging system (U.S. Patent No. 4606639). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4606639
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