The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1986
Filed:
Sep. 28, 1983
Robert M Peters, Wappingers Falls, NY (US);
Henri D Schnurmann, Monsey, NY (US);
Louis J Vidunas, Wappingers Falls, NY (US);
International Business Machines Corp., Armonk, NY (US);
Abstract
A system for automatically testing a plurality of memory arrays on selected memory array testers includes an interactive data entry device for entering array test specifications including characterizing information, DC testing parameters, AC testing parameters and AC test pattern choices for the array. The test specifications are entered in a format which is independent of a particular tester's characteristics. A universal language generator generates a tester independent universal language instruction sequence for carrying out the prescribed tests based upon the entered test specifications. Associated with each tester is a universal language translator which translates the tester independent universal language instruction sequence into an instruction sequence which is particular to the associated tester. The tester dependent instruction sequence may be loaded into the associated tester to produce the test signals for testing the memory array.