The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1986
Filed:
Dec. 20, 1982
Kathleen K Glass, Boulder, CO (US);
Lawrence J Haas, Broomfield, CO (US);
AT&T Bell Laboratories, Murray Hill, NJ (US);
Abstract
A diagnostic test facility for a processor having a plurality of boards hierarchically arranged with respect to processor function. The first and most independent board contains the processor microstore that stores the usual information plus the processor diagnostic subroutines required to test all boards. The processor is tested by executing the diagnostic subroutines associated with the first board and by collecting and comparing test data with predicted data as the subroutines are executed. The second board is tested by using the facilities on the first board and by executing diagnostic subroutines associated with the second board. In a similar manner the remaining hierarchically arranged boards are tested in sequence with the testing of each board using the circuitry on the priorly tested boards.