The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1986
Filed:
Sep. 13, 1982
Tetsuo Onishi, Wakayama, JP;
Yoshihide Sugiyama, Wakayama, JP;
Duplo Seiko Corp., both of, JP;
Duplo Manufacturing Corp., both of, JP;
Abstract
An illegal-sheet-material detecting apparatus, which is adapted to detect whether the property of each of the passing sheet materials is legal or not in a sheet manufacturing machine, provided with a comparison circuit for detecting the lag of the same detection value of the n th+ first sheet material with respect to the detection value showing the property such as thickness, size or the like of the optional portion of the n th sheet material memorized in the memory circuit as an electric signal. When the lag detected by the comparison circuit has exceeded a predetermined range, the counting operation of the sheet material is caused to stop thereby to use the detection value of the n th sheet material as a reference value for comparing it with the n th+ first sheet detection value.