The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1986
Filed:
Sep. 05, 1984
Applicant:
Inventors:
Walter H Lang, Konigsbronn, DE;
Klaus Biber, Aalen, DE;
Ulrich Lemcke, Heidenheim, DE;
Ulrich Sander, Heidenheim, DE;
Assignee:
Carl-Zeiss-Stiftung, Heidenheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350513 ; 350522 ; 3502 / ;
Abstract
The invention is directed to a double microscope for a surgeon and an assistant. The double microscope includes an optical splitter plate which splits the light coming from the operation field and directs the split beams to the two microscopes. The optical splitter plate, together with the objective of the assistant microscope and a beam deflection element, are all accommodated in a component connecting the two microscopes.