The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 1986

Filed:

Feb. 15, 1985
Applicant:
Inventors:

William A Edelstein, Schenectady, NY (US);

James M Hutchison, Aberdeen, GB;

Glyn Johnson, Aberdeen, GB;

Thomas W Redpath, Stonehaven, GB;

John R Mallard, Aberdeen, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324311 ;
Abstract

To produce image information from an object it is subjected to a continuous static magnetic field along a Z axis to sets of sequences of orthogonal gradients G.sub.x, G.sub.y and G.sub.z to the magnetic field. Spins in a selected plane (the X-Z plane) are excited by selective rf pulses and an associated G.sub.y gradient and the selected spins are subjected to all three gradients of which the G.sub.z gradient provides twist or warp to each column of spins extending along the Z axis to phase-encode the columns. The spin-echo signals are read out in the presence of a G.sub.x gradient. In each set of sequences a different value of Z gradient is employed. The Fourier transformed spin-echo signals obtained from each sequence, when arranged in order of increasing G.sub.z gradient and subjected to a second Fourier transform represent the distribution of spin density in the Z direction, thus giving a two-dimensional image of the selected X-Z plane.


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