The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1986
Filed:
Jun. 09, 1983
Tatsuo Hiroshima, Hyogo, JP;
Tetsuya Hirota, Hyogo, JP;
Sumitomo Metal Industries, Ltd., Osaka, JP;
Abstract
A technique for detecting flaws in a metal product which uses a combined eddy current and magnetic flaw detection technique. A first magnetic field having flux lines parallel to the surface of the test object and a second field having flux lines perpendicular to the surface of the test object are generated. The resultant magnetic field is affected by faults in the metal test object. A magnetic field detector adjacent the test object detects the resultant magnetic field and produces an output signal which is processed by a circuit to provide a pair of component signals representing the portion of the output signal corresponding to the individual components of the resultant magnetic field, thus providing an indication of the type of faults that are present in the test object. One, or both, of the individual magnetic fields can be generated by an electromagnet which is driven by an alternating current to thereby produce a rotary resultant magnetic field, thereby allowing greater flexibility in detecting all types of flaws.