The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 1986

Filed:

May. 31, 1983
Applicant:
Inventor:

Mitsuo Matsui, Tokyo, JP;

Assignee:

Fanuc Ltd., Minamitsuru, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
318603 ; 364561 ; 364444 ; 324323 ;
Abstract

A method of measuring a coordinate value of a prescribed point on an object, and an apparatus for practicing the method which, includes a step of generating a signal when a measuring element contacts the object at the prescribed point. In response to the signal, a pulse distribution operation based on a commanded amount of movement is suspended. The difference between a commanded position and a positional deviation is computed by arithmetic means. The deviation is the difference between a number of commanded pulses and a number of feedback pulses. The positional deviation is cleared from the contents of an error counter, thereby stopping the measuring element. The difference computed by the arithmetic means is the coordinate value of the prescribed point on the object.


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