The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1986
Filed:
Mar. 01, 1982
Applicant:
Inventor:
Hiroshi Tamaki, Tokyo, JP;
Assignee:
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ; 356125 ; 356127 ;
Abstract
An apparatus for measuring the optical characteristics of an optical system includes a light source, collimator means for collimating a beam of light from the light source, a mask means, a means for holding the optical system to be tested between the collimator means and the mask means, a detector, a calculator, and first beam splitting means. The mask means includes at least one mask provided in each optical path following the first beamsplitter means, each having a linear band group consisting of at least two parallel linear bands, with each mask disposed to provide a different orientation for the linear bands.