The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 1986

Filed:

Oct. 28, 1983
Applicant:
Inventor:

John D Lea, Huntington, NY (US);

Assignee:

Sperry Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
367125 ; 367127 ;
Abstract

An apparatus for determining an angle of incidence of a received signal utilizes two widely spaced interferometers with equal length crossing baselines. The time differential of a signal arrival between the two elements of each interferometer is established and the difference between the two time differentials is determined. Multiplying this difference by a predetermined constant provides the desired angle.


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