The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 1986
Filed:
Sep. 04, 1984
Edward E Bromberg, Peabody, MA (US);
Albert Diggens, Weston, MA (US);
Steven J West, Hull, MA (US);
James W Ross, Cambridge, MA (US);
Orion Research, Inc., Cambridge, MA (US);
Abstract
Apparatus for calibrating an ion analyzer comprises a calibration cell having defined therein a first volume for measuring an ion concentration of a sample when the instrument is operated in a monitoring and a second volume for measuring the ion concentration when the instrument is operated in a calibration mode. The first volume is included in, and forms part of, the second volume so that the matrix for the calibration measurement is essentially identical to that for the sample measurement. A double known-addition is used during the calibration mode to determine the calibration parameters.