The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 1986
Filed:
Feb. 02, 1983
Oded Kafri, Beer-Sheva, IL;
Aminadav Livnat, Arad, IL;
The State of Israel, Atomic Energy Commission, Beer-Sheva, IL;
Abstract
An optical instrument arrangement for determining the horizontality of a measured surface, where the arrangement comprises a solid reflecting device on a measured surface, a liquid reflecting device on a measured surface, a collimated light source positioned to direct collimated light beams onto both the solid reflecting device and the liquid reflecting device, a device for generating a first Moire fringe pattern from the solid light reflecting device and for also generating a second Moire pattern from the liquid reflecting device; and a device for simultaneously viewing the first and second Moire patterns to determine the horizontality of the measured surface from the shift of the second Moire pattern relative to the first Moire pattern.