The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 1986

Filed:

Sep. 07, 1984
Applicant:
Inventors:

Osamu Maida, Tokyo, JP;

Akira Katayama, Koganei, JP;

Assignee:

Nippon Kogaku K. K., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ;
U.S. Cl.
CPC ...
354448 ; 354455 ;
Abstract

An aperture control system comprises compensating means for actuating an electromagnetic latch mechanism at an earlier time to compensate errors in controlled aperture values due to the mechanical time delay in the electromagnetic latch mechanism, and means for setting a compensated amount in the compensating means in accordance with the error in a controlled aperture value for each interchangeable lens.


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