The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 1986

Filed:

Oct. 02, 1984
Applicant:
Inventor:

John E Fontenot, Houston, TX (US);

Assignee:

NL Industries, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73783 ; 73151 ;
Abstract

The present invention is directed to a method for determining the stress at the borehole boundary at a selected location within a borehole. The present invention comprises a method for determining the stress employing a plurality of mechanical properties of the formation, e.g., Poisson's Ratio, the rock strength properties and the elastic modulus, together with the measured deformation of the deformed borehole at the selected location. The method comprises measuring at the selected location a plurality of parameters indicative of the formation at that location and from which a plurality of mechanical properties of the formation, e.g., the rock strength properties, the elastic modulus and Poisson's Ratio are determinable, calipering the borehole at the selected location to determine the deformation of the deformed borehole and determining the stress at the borehole boundary at the selected location employing the information obtained by measuring and calipering.


Find Patent Forward Citations

Fontenot, John. (1986). Method for determining borehole stress from mwd parameter and caliper (U.S. Patent No. 4599904). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4599904

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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