The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 1986
Filed:
Jan. 25, 1984
Anthony J Devaney, Ridgefield, CT (US);
Schlumberger Technology Corporation, New York, NY (US);
Abstract
Diffraction tomography systems and methods are disclosed for the reconstruction of physical properties of two and three-dimensional objects from information collected by detectors located along an arbitrary surface in space. The sources of energy investigating the object may likewise be located along an arbitrary surface. Optimal filtered backpropagation techniques and preprocessing required for such reconstructions are disclosed for systems utilizing plane wave sources, and for systems using fan beam cylindrical or spherical wave insonification. The preprocessing and filtered backpropagation techniques are shown to simplify for the cases of circular boundaries, and other separable boundaries within the Helmholtz equation.