The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 1986

Filed:

Nov. 29, 1984
Applicant:
Inventors:

Kenkichi Sugiyama, Yokohama, JP;

Muneo Saito, Hachioji, JP;

Akio Wada, Hachioji, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 70 ; 73 231 ; 7386481 ; 7386483 ; 422 89 ;
Abstract

An apparatus for analyzing a sample with a supercritical fluid includes a fluid container containing as an extraction solvent a fluid obtained by compressing and liquefying a substance which is a gas at ambient temperature and atmospheric pressure. A pump is provided for drawing the fluid from its container through a suction line and delivering it through a delivery line, while the heads of the pump are cooled by a cooling device. An extraction mechanism is provided for bringing the fluid in a supercritical state into contact with the sample to be analyzed and extracting a specific component or components from the sample. A trapping mechanism is provided downstream of the extraction mechanism for collecting the extracted component or components from the fluid. An analyzing mechanism can be connected to the trapping mechanism by changeover valves for analyzing the collected component or components.


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