The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 1986

Filed:

Jun. 01, 1983
Applicant:
Inventors:

Barrett H Ripin, Silver Spring, MD (US);

Robert R Whitlock, College Park, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
376153 ; 356318 ;
Abstract

An apparatus for measuring the emissivity and opacity coefficients of a test plasma. The apparatus includes a target comprising a support structure of a carrier material with an asymmetrical sample of a test material disposed thereon, a driver for ionizing the test material into a test plasma and the carrier material into a carrier plasma, and spectrographs for measuring the intensity of photons traversing said test plasma. Embodiments including a separate photon source are also disclosed.


Find Patent Forward Citations

Ripin, Barrett. (1986). Radiative opacity and emissivity measuring device (U.S. Patent No. 4597933). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4597933

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…