The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 1986
Filed:
Jan. 09, 1985
Hiroshi Kanda, Tokorozawa, JP;
Isao Ishikawa, Hino, JP;
Kageyoshi Katakura, Meguro, JP;
Chitose Nakaya, Nishitama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An acoustic microscope wherein an ultrasonic beam is projected on a sample through a propagating medium by an ultrasonic transducer having a short focus, reflected acoustic waves from the sample are detected by the transducer, and a microscopic image of the sample is obtained by scanning the sample mechanically in two dimensions, comprises a cover member which is interposed between the sample and the propagating medium and which has an acoustic impedance higher than those of the two. The intensity of a reflection signal depends upon multipath reflection within the cover member, and an intense reflection signal is obtained even for a sample which differs slightly in the acoustic impedance from the propagating medium.