The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 1986
Filed:
Apr. 14, 1983
Applicant:
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01B / ;
U.S. Cl.
CPC ...
324242 ; 73622 ; 324207 ; 324226 ; 324227 ; 324262 ;
Abstract
Apparatus for detecting flaws on the circumference of a rounded bar of metal. A circular rotator means held by a support is rotated around the material to be inspected for flaws. The rotator means has a number of probes which are revolved around the circumference of the material to detect flaws when the rotator means is rotated. If and when the material deviates from its axis predetermined through the apparatus while passing therethrough, the deviation is detected and the support is displaced in the same direction and distance as the material so that the probes remain spaced apart from the circumference of the material at a predetermined distance while inspecting the material for flaws.