The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 1986
Filed:
Mar. 15, 1985
Gerhard Hofmeier, Hamburg, DE;
Wolfgang Tscheu, Henstedt-Ulzburg, DE;
Abstract
A measuring system comprises ion-selective electrodes adjoining a measuring passage, which has an inlet and an outlet. The measuring passage has bends, which are adjoined by the sensing electrodes, which are flush with the boundary surface of that measuring passage. Said bends extend also before and behind each electrode. The sensing electrodes are provided at the outside surface of each bend so that they will be effectively rinsed and errors due to entrained impurities will be avoided. The measuring passage is suitably substantially circular but has entrance and exit portions offset from the circular line. The electrodes are provided on the outside particularly in a star-shaped array. The measuring system is provided with a shield consisting of a closed, electrically conducting covering, which preferably consists of a metallic cover. Contact and contact pressure springs are subjected to a uniform stress because the cover is mounted with play by means of a hinge so that self-alignment will be effected.