The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 1986

Filed:

Sep. 18, 1984
Applicant:
Inventor:

Tadashi Fujii, Fujinomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73599 ; 128660 ;
Abstract

A method and apparatus wherein two probes are arranged to oppose each other on either side of an object under investigation and each of two probes emits ultrasonic waves to measure the acoustic characteristics of the object respectively. Mean attenuation coefficients for small intervals can be calculated solely from the received echo signals by processing signals indicative of echos of the ultrasonic waves from the two probes. Reflection coefficients can be calculated from the mean attenuation coefficients obtained. In addition, a distribution image of either of the mean attenuation coefficient and reflection coefficient distributions are obtained from these mean attenuation coefficients and reflection coefficients for the small intervals.


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