The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 1986

Filed:

Jun. 19, 1984
Applicant:
Inventors:

Yuya Abe, Tokyo, JP;

Toshio Sawa, Sayama, JP;

Assignee:

Nippo Sangyo Co. Ltd., Kokubunjii, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73-9 ; 73146 ;
Abstract

A dynamic friction coefficient measuring apparatus includes a friction measuring portion having a disc with a friction measuring rubber member attached thereto, a driving disc adapted to rotate coaxially with the disc and a dynamometer which interconnects the disc and the driving disc. A tachometer measures the speed of the rubber member during rotation of the friction measuring portion. An X-Y recorder records two electric outputs of the friction measuring portion and the tachometer onto rectangular coordinates.


Find Patent Forward Citations

Abe, Yuya. (1986). Dynamic friction coefficient measuring apparatus (U.S. Patent No. 4594878). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4594878

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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