The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 1986
Filed:
Sep. 19, 1983
Applicant:
Inventor:
Anthony J Devaney, Ridgefield, CT (US);
Assignee:
Schlumberger Technology Corporation, New York, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ; G01N / ; G06F / ;
U.S. Cl.
CPC ...
364400 ; 73602 ; 128660 ; 250256 ; 364414 ; 364421 ; 364422 ; 378901 ;
Abstract
Diffraction tomography systems and methods are disclosed for the reconstruction of physical properties of two- and three-dimensional objects from information collected by detector arrays which are fixed in space. Improved preprocessing procedures and an optimal filtered backpropagation technique are disclosed for both geophysical and ultrasonic diffraction tomography systems and methods. A novel method for reconstructing properties of three-dimensional objects and slices thereof in real time is also disclosed. An optimal filtered backpropagation technique for the backscatter mode is further disclosed.