The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 1986

Filed:

Jun. 09, 1983
Applicant:
Inventor:

Masatoshi Ida, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250204 ; 354407 ;
Abstract

An apparatus and method for detecting focus condition of an imaging optical system is disclosed. The apparatus comprises means for dividing a light flux transmitted through the imaging optical system into two sub-light fluxes, first and second light receiving element arrays disposed in front of and at the rear of a predetermined focal plane or a plane conjugated therewith and each having a plurality of light receiving elements, a light flux dividing optical system arranged at the light incident side of the light receiving element arrays for partially cutting incident light and constructed in such a manner that images projected upon respective light receiving element arrays by respective light fluxes transmitted mainly through first and second regions of the imaging optical system, which are divided by a plane including an optical axis of the imaging optical system, are shifted in the array direction in accordance with the amount of defocused condition, means for obtaining first and second evaluation functions representing image sharpness and third and fourth evaluation functions representing image lateral shift by processing outputs of the first and second light receiving element arrays, and means for deciding the defocused condition and the in-focused condition by arithmetically operating all evaluation functions.


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