The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 1986

Filed:

May. 08, 1984
Applicant:
Inventors:

Werner Poppe, Bobenheim-Roxheim, DE;

Rainer van Rijekevorsel, Bruhl, DE;

Uwe Ruppender, Mannheim, DE;

Heinz Macho, Mannheim, DE;

Assignee:

Boehringer Mannheim GmbH, Mannheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
422 56 ; 235375 ; 235462 ; 422 67 ; 427-2 ;
Abstract

An analysis test strip and a process for the production of analysis test strips with a longitudinal carrier upon which is fixed at least one test field. The test field material is produced batchwise in an amount sufficient for a plurality of test strips, and thereafter, in a chronologically separate working step, is continuously fixed in the form of at least one band onto a parallel-running substantially wider band of test strip carrier material. The band as a whole is cut up transversely to its longitudinal direction into a plurality of test strips. Prior to the cutting up, a bar code is applied to the carrier band running parallel to the edges thereof of such high information density that it is suitable as a store of batch-specific information necessary for the quantitative evaluation of the reaction which has previously been obtained by investigation of the test field material of one batch.


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