The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 1986

Filed:

May. 14, 1984
Applicant:
Inventor:

Desmond Wheable, Basingstoke, GB;

Assignee:

Transamerica Delaval Inc., Lawrenceville, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
374143 ; 374164 ; 73708 ;
Abstract

Methods and apparatus for measuring a non-thermal physical parameter with temperature sensitive elements impart a predetermined temperature sensitive elements, while measuring the physical parameter therewith. The same termperature-sensitive elements are employed for effecting a measurement of environmental temperature variation, and such temperature-sensitive elements are restored to their predetermined temperature in response to that measurement of environmental temperature variation effected with these temperature-sensitive elements.


Find Patent Forward Citations

Wheable, Desmond. (1986). Temperature-controlled systems for non-thermal parameter measurements (U.S. Patent No. 4592665). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4592665

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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