The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 1986

Filed:

Feb. 08, 1984
Applicant:
Inventors:

Akira Hashimoto, Hitachi, JP;

Susumu Saito, Hachioji, JP;

Akira Arimoto, Musashimurayama, JP;

Kenji Morita, Hachioji, JP;

Assignees:

Hitachi Koki Co., Ltd., Tokyo, JP;

Hitachi Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F / ;
U.S. Cl.
CPC ...
350395 ; 350-68 ;
Abstract

A light-beam scanning apparatus is disclosed in which a mirror surface of a metal having a characteristic that the reflectance of the mirror surface increases as the incident angle of light incident on the mirror surface is larger, is used as a reflecting surface, the optical thickness nd of a transparent protective film formed on the reflecting surface is made substantially equal to m.lambda./2 (where n, d, m and .lambda. indicate the refractive index of the protective film, the thickness of the protective film, an integer, and the wavelength of the incident light, respectively), the incident light is linearly-polarized light, and the direction of vibration of the linearly-polarized light is inclined at an angle of about +40.degree. to -40.degree. to a direction perpendicular to the plane of incidence of the linearly-polarized light.


Find Patent Forward Citations

Loading…