The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 1986
Filed:
Aug. 17, 1984
Kee P Koo, Alexandria, VA (US);
George H Sigel, Jr, Great Falls, VA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A fiber optic magnetic gradiometer for measuring both ac and dc magnetic field gradients. The gradiometer utilizes an optical interferometer with magnetostrictive magnetic field sensing elements in each of the interferometer arms. Ac and dc magnetic field biasing is achieved by disposing each of the magnetic field sensing elements within its own magnetic field coil and utilizing a variable dc current source for applying dc current to each magnetic coil. An ac current source at frequency w.sub.o connected across the circuits for the dc current sources is used in conjunction with a variable attenuator to control the ac bias to the respective magnetic coils. The detected output from the interferometer is processed either by bandpass filters or a spectrum analyzer to obtain the signal component at w.sub.o, which is proportional to the external dc gradient magnetic field, and at w.sub.o +w.sub.s, (where w.sub.s is external ac magnetic field frequency), which is proportional to the external ac magnetic field gradient.